The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Sep. 21, 2011
Applicant:

Stanley L. Kaufman, New Brighton, MN (US);

Inventor:

Stanley L. Kaufman, New Brighton, MN (US);

Assignee:

TSI, Incorporated, Shoreview, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/45 (2006.01); G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 15/0612 (2013.01); G01N 21/45 (2013.01); G01N 15/065 (2013.01); G01N 2021/458 (2013.01);
Abstract

Methods and apparatuses for the removal, analysis and/or detection of harmful airborne molecular contaminants (AMCs). In one embodiment, an ionizing radiation source is utilized to remove the harmful AMCs from a flow stream via radiolytic particle generation and subsequent capture by filtration. The captured particles may be released, for example, by re-gasification for analysis at much higher concentrations. In another embodiment, the ionizing radiation source is utilized with a particle detector to sense when harmful AMCs are present. In one embodiment, a solid optical medium is exposed to a monitored environment so that the AMCs are in contact with a surface of the solid optical medium. A focused light beam is arranged to emerge from a solid optical medium at an energy density sufficient to cause the AMCs to form deposits on the exposed surface of the solid optical medium, which can be detected using an interferometric technique.


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