The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Jun. 30, 2014
Applicant:
Streck, Inc., LaVista, NE (US);
Inventors:
Matthew R. Kreifels, Omaha, NE (US);
Scott E. Whitney, Lincoln, NE (US);
Gregg Wilder, Strafford, NH (US);
John Flanagan, Holbrook, MA (US);
James Dowling, New Boston, NH (US);
Philip Hills, Deerfield, NH (US);
Michael Tilleman, Brookline, MA (US);
Jeremie Jackson, Mont Vernon, NH (US);
Assignee:
Streck, Inc., LaVista, NE (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); C12Q 1/686 (2018.01); B01L 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6428 (2013.01); C12Q 1/686 (2013.01); G01N 21/645 (2013.01); B01L 7/52 (2013.01); C12Q 2561/113 (2013.01); C12Q 2563/107 (2013.01); G01N 2201/062 (2013.01); G01N 2201/068 (2013.01);
Abstract
An improved device and system for facilitating polymerase chain reaction including a light source, detector, waveguide, and filters that occupy minimal space and facilitate detection of stationary samples, reduced sample read time, and simultaneous reading of multiple light wavelengths.