The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Nov. 22, 2016
California Institute of Technology, Pasadena, CA (US);
Axel Scherer, Barnard, VT (US);
Frank T. Hartley, Arcadia, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
MIR spectroscopy systems comprising hierarchical spectral dispersion that enables fine spectral resolution and high sensitivity spectroscopy are disclosed. Hierarchical spectral dispersion is derived by employing at least two diffractive lens arrays, located on either side of a test sample, each receiving input radiation having an input spectral range and distributing the input radiation into a plurality of output signals, each having a fraction of the spectral range of the input radiation. As a result, the signal multiplication factor of the two arrays is multiplied in a manner that mitigates the propagation of wavelength harmonics through the system. In some embodiments, an emitter array comprising a plurality of spectrally selective emitters provides the input MIR radiation to a spectroscopy system. In some embodiments, spectrally selective detectors are used to detect narrow spectral components in the radiation after they have passed through the test sample.