The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Oct. 21, 2016
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Tsugio Gomi, Fujimi, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); G01N 21/25 (2006.01); G01N 21/27 (2006.01); B41J 11/00 (2006.01); G01J 3/46 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/251 (2013.01); B41J 11/0095 (2013.01); B41J 29/38 (2013.01); G01J 3/46 (2013.01); G01N 21/27 (2013.01); G01N 21/31 (2013.01); G01N 2201/062 (2013.01); G01N 2201/068 (2013.01); G01N 2201/0612 (2013.01); G01N 2201/0633 (2013.01);
Abstract
A spectrometer includes a light source that radiates illumination light, and a measurement unit that measures measurement light in which illumination light is reflected by a medium. In a case where an illumination region that is a region in which the medium is irradiated with illumination light is smaller than a measurement region that is a region of the medium measurable by the measurement unit and in which the movement of the medium in the direction is within a range of an acceptable fluctuation amount, the illumination region is included in the measurement region.