The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

May. 19, 2015
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Kei Tanaka, Kyoto, JP;

Kazuhiro Shiomi, Kyoto, JP;

Yoshifumi Sugihara, Kyoto, JP;

Yoku Hirose, Kyoto, JP;

Kazuki Furukawa, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 17/007 (2006.01); G01M 13/02 (2006.01); G01M 15/02 (2006.01);
U.S. Cl.
CPC ...
G01M 17/007 (2013.01); G01M 17/0072 (2013.01); G01M 13/02 (2013.01); G01M 15/02 (2013.01);
Abstract

A vehicle testing system includes: an actuator for operating a vehicle or a part of a vehicle in a predetermined algorithm; an operating conditions calculating unit that calculates operating conditions being applied to a component of the vehicle or a component of the part of the vehicle during the operation of the vehicle or the part of the vehicle by the actuator; and a component testing device that connects to the component, in which the component testing device operates and applies to the component the operating conditions calculated by the operating conditions calculating unit.


Find Patent Forward Citations

Tanaka, Kei. (2018). Vehicle testing system (U.S. Patent No. 10006834). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10006834

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…