The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Jan. 04, 2017
Applicant:

Altec Industries, Inc., Birmingham, AL (US);

Inventor:

David K. Boger, Sonoma, CA (US);

Assignee:

Altec Industries, Inc., Birmingham, AL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01L 19/12 (2006.01); G01B 11/16 (2006.01); E21B 7/04 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01); G01L 19/12 (2013.01); E21B 7/046 (2013.01); G01B 11/16 (2013.01);
Abstract

A deflection detection system determines a deflection of a boom assembly. The deflection detection system may include a beam source, a beam target, and a processor. The beam source is configured to be installed into a hollow boom section at a first end and configured to emit a beam. The beam target configured to be installed into the hollow boom section at a second end that is opposite the first end. The processor is configured to instruct the beam source to emit the beam; acquire a first target-impact indication that is associated with a first impact location of the beam on the beam target; acquire a second target-impact indication that is associated with an impact location of the beam on the beam target; and determine a deflection of the hollow boom section based at least in part on the first target-location and the second target-location indication.


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