The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Jul. 26, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Hisayoshi Furihata, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
To measure a three-dimensional shape of a measurement target object at high speeds, an information processing apparatus is configured to acquire an image captured while a pattern including first features and a second feature is projected onto the measurement target object; identify the first features in the captured image, and acquire an initial value of shape information on the measurement target object in an area including the first features; set a candidate for the shape information in a first area based on an initial value of shape information in an area surrounding the first area; decide an area in the pattern corresponding to the first area as a second area, and evaluate a correlation between the second area and the first area based on the second feature in the first area and the second feature in the second area; and derive the shape information in the first area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile