The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

May. 10, 2016
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Jorge A. Alvarez, Webster, NY (US);

Michael F. Zona, Webster, NY (US);

William J. Nowak, Webster, NY (US);

Robert A. Clark, Williamson, NY (US);

Chu-heng Liu, Penfield, NY (US);

Paul J. McConville, Webster, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/264 (2017.01); G03G 15/00 (2006.01); B29C 65/78 (2006.01); B29C 65/00 (2006.01); B29C 64/393 (2017.01); B29C 64/40 (2017.01);
U.S. Cl.
CPC ...
B29C 64/264 (2017.08); B29C 64/393 (2017.08); B29C 64/40 (2017.08); B29C 65/7852 (2013.01); B29C 66/954 (2013.01); G03G 15/00 (2013.01);
Abstract

3-D printers include an intermediate transfer surface that transfers a layer of material to a platen each time the platen contacts the intermediate transfer surface to successively form a freestanding stack of layers of the material on the platen. A sensor detects the thickness of the layer on the platen after a fusing station fuses the layer. A feedback loop is electrically connected to the sensor and a development station (that includes a photoreceptor, a charging station providing a static charge to the photoreceptor, a laser device exposing the photoreceptor, and a development device supplying the material to the photoreceptor). The exposure device adjusts the intensity of light exposed on the photoreceptor, based on a layer thickness measurement from the sensor through the feedback loop, to control the thickness of subsequent ones of the layers transferred from the intermediate transfer surface to the freestanding stack on the platen.


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