The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Nov. 11, 2013
Koninklijke Philips N.v., Eindhoven, NL;
Ajay Anand, Fishkill, NY (US);
Shriram Sethuraman, Briarcliff Manor, NY (US);
Balasundar Iyyavu Raju, Chester, NY (US);
Junbo Li, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
The invention relates to a temperature distribution determining apparatus () for determining a temperature distribution within an object, to which energy is applied, by using an energy application element (). A first temperature distribution is measured in a first region within a first temperature range and a model describing a model temperature distribution in the first region and in a second region depending on modifiable model parameters is provided. A second temperature distribution is estimated in the second region within a second temperature range, while the energy is applied to the object, by modifying the model parameters such that a deviation of the model temperature distribution from the first temperature distribution in the first region is minimized. This allows considering the temperature dependence of the model parameters within the second temperature range, while estimating the second temperature distribution, thereby improving the accuracy of the estimation of the second temperature distribution.