The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2018
Filed:
Oct. 15, 2015
Koninklijke Philips N.v., Eindhoven, NL;
Jinghan Ye, Cupertino, CA (US);
Xiyun Song, Cupertino, CA (US);
Thomas Leroy Laurence, North Royalton, OH (US);
Sharon Xiaorong Wang, Highland Heights, OH (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A diagnostic imaging system includes a plurality of radiation detectors () configured to detect radiation events emanating from an imaging region. The system includes a calibration phantom () configured to be disposed in the imaging region spanning substantially an entire field of view and to generate radiation event pairs that define lines-of-response, wherein the calibration phantom is thin such that each LOR intersects the calibration phantom along its length, the thickness of the phantom being smaller than the length of the LORs. A calibration processor () receives input of the radiation detectors and calculates an incidence angle independent crystal delay Tfor each detector. The calibration processor () constructs a first look-up table for the timing correction of each LOR and a second look-up table for the angle depth of interaction correction for each crystal by combining Tand η.