The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Jan. 31, 2014
Applicant:

Duke University, Durham, NC (US);

Inventors:

David Jones Brady, Durham, NC (US);

Lawrence L. Carin, Chapel Hill, NC (US);

Yan Kaganovsky, Durham, NC (US);

Assignee:

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); A61B 6/03 (2006.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01); G01V 5/00 (2006.01); A61B 6/00 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4007 (2013.01); A61B 6/4085 (2013.01); A61B 6/4266 (2013.01); A61B 6/52 (2013.01); G01N 23/046 (2013.01); G01V 5/005 (2013.01); G06T 7/0012 (2013.01); G06T 11/003 (2013.01); G01N 2223/419 (2013.01); G01N 2223/42 (2013.01); G06T 2207/10081 (2013.01);
Abstract

A method and system for forming tomographic images of an object using discrete, non-continuous illumination rays is disclosed. In some embodiments, coded apertures, collimation filters, or reference structures are used to filter the set of illumination rays from a two- or three-dimensional radiation signal, wherein the set of illumination rays are then used to interrogate the object. In some embodiments, the object is interrogated with a set of illumination rays that is continuous and a sparse array of detectors is used to sub-sample the illumination rays after they have passed through the object.


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