The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Jun. 11, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Marcus Wuebbe, Herzogenaurach, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61B 5/055 (2006.01); G01R 33/483 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0555 (2013.01); G01R 33/4833 (2013.01); G01R 33/543 (2013.01); A61B 2560/0475 (2013.01); A61B 2576/00 (2013.01); G01R 33/546 (2013.01);
Abstract

In a method for slice positioning of an examination subject in a magnetic resonance system an item of localization information describing the arrangement of the examination subject is automatically determined at least one item of alignment information is automatically determined. At least one slice positioning entry is acquired by an operator, which includes a selection of one of the items of alignment information or an item of manual positioning information. Offset information, which includes a relative slice positioning effected by the manual positioning information, is automatically determined and the slice positioning is determined as a function of the slice positioning entries and the offset information. The offset information is stored separately from the slice positioning in a magnetic resonance measurement protocol, and is used in a further configuration of a further slice positioning.


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