The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Apr. 15, 2016
Applicant:
Pitney Bowes Inc., Danbury, CT (US);
Inventors:
Anand Kannan, North York, CA;
Andrew Kane, Cheshunt, GB;
Assignee:
Pitney Bowes Inc., Stamford, CT (US);
Primary Examiner:
Int. Cl.
CPC ...
H04M 11/04 (2006.01); H04W 4/22 (2009.01); H04W 4/02 (2018.01); G06N 5/02 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
H04W 4/22 (2013.01); G06N 5/02 (2013.01); H04W 4/02 (2013.01); G06F 17/3087 (2013.01); G06F 17/30241 (2013.01); G06F 17/30327 (2013.01); G06F 17/30333 (2013.01); G06F 17/30392 (2013.01); G06F 17/30961 (2013.01);
Abstract
An improved method is provided for determining whether a sample point is within a defined geographic area. Indexes for the geographic area of interest are generated in advance. Such indexes complement the traditional spatial indexing techniques such as quad tree and r-tree. The geographic area, as defined by an outer boundary, is subdivided into some regular geometric shape, preferably a rectangle, encoded into a suitable form, and indexed. Then, a simplified comparison of the sample point to the indexed regular shapes is made.