The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Jun. 02, 2017
Anritsu Company, Morgan Hill, CA (US);
Donald Anthony Bradley, Morgan Hill, CA (US);
ANRITSU COMPANY, Morgan Hill, CA (US);
Abstract
A system for measuring electrical characteristics of a device under test (DUT) includes a measuring instrument adapted to be connected with the DUT for transmitting tests signals to the DUT, a receiver adapted to be connected with the DUT and arranged remote from the measuring instrument, an optical transceiver having a first coupler electrically connectable with the measuring instrument and a second coupler electrically connectable with the receiver, and a first and second free space transceivers connected to respective couplers by fiber optic cable. The measuring instrument includes a clock signal generated from a synchronization signal. The synchronization signal is converted to an optical signal by the optical transceiver and transmitted from the first free space transceiver to the second free space transceiver. The second coupler converts the optical signal to the synchronization signal and a clock signal of the receiver is locked to the synchronization signal.