The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Apr. 11, 2017
Litepoint Corp., Sunnyvale, CA (US);
Ramakrishna Yellapantula, Vernon Hills, IL (US);
Chandra Punyapu, Aurora, IL (US);
Malhar Vaishnav, Gilberts, IL (US);
Soumyadeep Banerjee, Arlington Heights, IL (US);
LitePoint Corporation, Sunnyvale, CA (US);
Abstract
A testing apparatus obtains user equipment (UE) parametric measurements with unknown and/or unavailable authentication and security information. The testing apparatus may obtain uplink and downlink parameters of a wireless device after the wireless device initiates registration while an associated timer is activated, enabling the testing apparatus to obtain additional measurement information without security information about the tested wireless device. The apparatus may also measure the UE's transmitted power level prior to the initiation of the authentication procedure. The testing apparatus may determine if a wireless device is to be tested at another frequency pair. If so, the testing apparatus redirects the wireless device to a radio resource at the other frequency pair. The testing apparatus then obtains uplink and downlink parameters for the wireless device by performing pre-registration and intra-registration measurements at the other frequency pair. The procedure is repeated until measurements for all desired frequency pairs are completed.