The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Dec. 16, 2016
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Paul Gareth Lloyd, Munich, DE;
Rohde & Schwarz GMBH & Co. KG, Munich, DE;
Abstract
A method for measuring characteristics of a transmitter unit of a device under test is described. A signal generator is provided that comprises a baseband processing unit having at least a digital pre-distortion sub-unit. A device under test is provided that has a transmitter unit. A measuring unit is provided. Said signal generator and said device under test are connected with each other via an interface. At least one input signal is generated by using said signal generator, said input signal is forwarded to said device under test. An output signal of said device under test is measured by using said measuring unit. A first pre-distortion parameter for an increasing input amplitude is determined by using said digital pre-distortion sub-unit. A second pre-distortion parameter for a decreasing input amplitude is determined by using said digital pre-distortion sub-unit. Said first and second pre-distortion parameters are determined such that said output signal has a high fidelity. Further, a test system and a radio frequency device are described.