logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10002914 B1

PDFFull Text
Date of Patent:
Jun. 19, 2018

Filed:

Mar. 29, 2017

Method of manufacturing a display apparatus having pixels areas with different thicknesses

Applicant:

Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;

Inventors:

Seonju Kim, Yongin-si, KR;

Youngrok Song, Yongin-si, KR;

Jungbae Song, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:

Knobbe, Martens, Olson & Bear, LLP

Primary Examiner:

Dung Le

Int. Cl.
CPC ...
H01L 27/32 (2006.01); H01L 51/52 (2006.01); H01L 51/56 (2006.01); H01L 21/66 (2006.01); C23C 14/24 (2006.01); C23C 14/54 (2006.01); C23C 14/02 (2006.01); C23C 14/04 (2006.01); C23C 14/58 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3246 (2013.01); C23C 14/021 (2013.01); C23C 14/042 (2013.01); C23C 14/24 (2013.01); C23C 14/542 (2013.01); C23C 14/547 (2013.01); C23C 14/5826 (2013.01); H01L 22/10 (2013.01); H01L 22/12 (2013.01); H01L 22/20 (2013.01); H01L 27/3258 (2013.01); H01L 51/001 (2013.01); H01L 51/0017 (2013.01); H01L 51/0031 (2013.01); H01L 51/5206 (2013.01); H01L 51/5271 (2013.01); H01L 51/56 (2013.01); H01L 2227/323 (2013.01); H01L 2251/558 (2013.01);
Abstract

A method of manufacturing a display apparatus having a base with a plurality of pixel electrode and pixel definition layers, wherein the base is divided into a plurality of areas comprising a first area and a second area; the method comprising measuring reflectivities of the first and second areas, wherein a measured reflectivity of the first area is different from that of the second area; placing the base in a deposition chamber; and forming a first intermediate layer over a first one of the pixel electrodes in the first area; moving the base relative to the deposition unit; forming a second intermediate layer over a second one of the pixel electrodes in the second area, wherein the first intermediate layer has a first thickness and the second intermediate layer has a second thickness different from the first thickness.

Find Patent Forward Citations

Loading…