The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Jun. 08, 2016
Applicant:

Soitec, Bernin, FR;

Inventors:

Bich-Yen Nguyen, Austin, TX (US);

Frederic Allibert, Albany, NY (US);

Christophe Maleville, Laterasse, FR;

Assignee:

Soitec, Bernin, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/425 (2006.01); H01L 27/12 (2006.01); H01L 21/265 (2006.01); H01L 21/84 (2006.01); H01L 21/266 (2006.01); H01L 23/66 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1203 (2013.01); H01L 21/266 (2013.01); H01L 21/26506 (2013.01); H01L 21/26533 (2013.01); H01L 21/84 (2013.01); H01L 23/66 (2013.01);
Abstract

A method for manufacturing a high-resistivity semiconductor-on-insulator substrate comprising the steps of: a) forming a dielectric layer and a semiconductor layer over a high-resistivity substrate, such that the dielectric layer is arranged between the high-resistivity substrate and the semiconductor layer; b) forming a hard mask or resist over the semiconductor layer, wherein the hard mask or resist has at least one opening at a predetermined position; c) forming at least one doped region in the high-resistivity substrate by ion implantation of an impurity element through the at least one opening of the hard mask or resist, the semiconductor layer and the dielectric layer; d) removing the hard mask or resist; and e) forming a radiofrequency (RF) circuit in and/or on the semiconductor layer at least partially overlapping the at least one doped region in the high-resistivity substrate.


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