The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Jul. 28, 2016
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Inventor:
Sang-In Park, Anyang-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/04 (2006.01); G11C 29/44 (2006.01); G11C 29/26 (2006.01); G11C 29/02 (2006.01); G11C 29/40 (2006.01); G11C 29/00 (2006.01); G11C 16/04 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/26 (2013.01); G11C 29/025 (2013.01); G11C 29/40 (2013.01); G11C 29/78 (2013.01); G11C 16/0483 (2013.01); G11C 29/44 (2013.01); G11C 2029/1204 (2013.01); G11C 2029/4402 (2013.01);
Abstract
A nonvolatile memory device includes a memory cell array, a page buffer connected to bit lines of the memory cell array, a defect detector, and an input/output circuit. The defect detector receives readout data from the page buffer through the bit lines and performs a logical operation based on the readout data for a plurality of column units. The defect detector outputs defective data based on the logical operation. The input/output circuit outputs the defective data based on a control signal.