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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10002650 B1

PDFFull Text
Date of Patent:
Jun. 19, 2018

Filed:

Dec. 21, 2016

Signal quality detection circuit for generating signal quality detection result according to two-dimensional nominal sampling point pattern and associated signal quality detection method

Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventor:

Pin-Huan Hsu, Taipei, TW;

Assignee:

MEDIATEK INC., Hsin-Chu, TW;

Attorney:

Winston Hsu

Primary Examiner:

Viet Q Nguyen

Int. Cl.
CPC ...
G11C 7/06 (2006.01); G11C 7/22 (2006.01); H03K 5/24 (2006.01); G11C 8/18 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G11C 7/22 (2013.01); G01R 31/31708 (2013.01); G11C 8/18 (2013.01); H03K 5/24 (2013.01);
Abstract

A signal quality detection circuit has a sampling circuit and a comparing circuit. The sampling circuit samples an input signal associated with a target device according to a plurality of nominal sampling points, and generates a plurality of sampled bits corresponding to the nominal sampling points, respectively. The nominal sampling points are set by different combinations of sampling time and sampling reference voltage, and the number of the nominal sampling points is larger than four. The comparing circuit generates a signal quality detection result by performing comparison according to the sampled bits.

Find Patent Forward Citations

Hsu, Pin-Huan. (2018). Signal quality detection circuit for generating signal quality detection result according to two-dimensional nominal sampling point pattern and associated signal quality detection method (U.S. Patent No. 10002650). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10002650

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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