The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Sep. 25, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Fitzgerald John Archibald, Toronto, CA;

John Keith Schneider, Williamsville, NY (US);

Frederick Kiefer, Williamsville, NY (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00093 (2013.01); G06K 9/00013 (2013.01); G06K 9/00073 (2013.01);
Abstract

Apparatuses, systems, and techniques are disclosed for rapidly identifying potential candidates within a pool of enrolled fingerprint images for unconstrained fingerprint matching with an inquiry fingerprint. The techniques may include applying one or more window regions to both enrolled and inquiry fingerprint images and determining a minutiae score for each such window region based on the minutiae within that window region. One or more components of the minutiae score for window regions of the inquiry image may then be compared against similar components in the minutiae scores for window regions of the enrolled fingerprint images, and enrolled fingerprint images having window regions with minutiae scores sufficiently similar to the minutiae score of a window region of the inquiry fingerprint image may be selected for later unconstrained matching with the inquiry fingerprint image.


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