The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Jan. 27, 2016
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Hirokazu Kubo, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); H04N 7/18 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G02B 21/0064 (2013.01); G02B 21/361 (2013.01);
Abstract

A laser microscope apparatus including: a scanning unit that scans laser light on a sample; an objective lens that collects observation light from the sample; a photo-detection unit that has a light-receiving surface formed of an array of a plurality of detecting elements capable of detecting a single photon, that receives the observation light incident on the light-receiving surface, and that outputs intensity signals having intensities corresponding to the amounts of the received observation light; an image generating unit that generates an image on the basis of the intensities of the intensity signals and scanning positions of the laser light; a processor for notifying a user when the intensity signals used to generate the image include intensity signals having intensities equal to or larger than a predetermined threshold that is set according to the beam diameter of the observation light incident on the light-receiving surface.


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