The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Oct. 25, 2011
Jeffrey H. Price, San Diego, CA (US);
Derek N. Fuller, San Diego, CA (US);
Albert L. Kellner, San Diego, CA (US);
Behrad Azimi, La Jolla, CA (US);
Jeffrey H. Price, San Diego, CA (US);
Derek N. Fuller, San Diego, CA (US);
Albert L. Kellner, San Diego, CA (US);
Behrad Azimi, La Jolla, CA (US);
Sanford Burnham Medical Research Institute, La Jolla, CA (US);
Vala Sciences, Inc., San Diego, CA (US);
Abstract
Multifunction autofocus for automated microscopy includes automatic coarse focusing of an automated microscope by reflective positioning, followed by automatic image-based autofocusing of the automated microscope performed in reference to a coarse focus position. In some aspects, the image-based autofocusing utilizes astigmatism in microscope optics for multi-planar image acquisition along a Z axis direction of a microscope. In some other aspects, the image-based autofocusing utilizes astigmatism in microscope optics in combination with chromatic aberration for multi-planar image acquisition along the Z axis direction.