The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Oct. 22, 2013
Applicant:

Oki Electric Industry Co., Ltd., Tokyo, JP;

Inventors:

Daisuku Okuya, Tokyo, JP;

Kurato Maeno, Tokyo, JP;

Michiyo Matsui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/58 (2006.01); G01V 3/12 (2006.01); G01S 7/41 (2006.01); G01S 13/53 (2006.01); G01S 13/526 (2006.01); A61B 5/0205 (2006.01); G01S 13/52 (2006.01); G01S 13/524 (2006.01); A61B 8/00 (2006.01); G01S 7/292 (2006.01); G01S 13/50 (2006.01);
U.S. Cl.
CPC ...
G01S 13/58 (2013.01); G01S 7/415 (2013.01); G01V 3/12 (2013.01); A61B 5/0205 (2013.01); A61B 8/00 (2013.01); G01S 7/292 (2013.01); G01S 13/50 (2013.01); G01S 13/52 (2013.01); G01S 13/526 (2013.01); G01S 13/5244 (2013.01); G01S 13/53 (2013.01);
Abstract

Provided is a state recognizing device including: a first filter unit performing a filtering process on a time-series signal obtained by performing remote measuring on a space, in accordance with a first cutoff frequency to allow a signal component deriving from movement of a biological organism to pass through; a second filter unit performing a filtering process on the time-series signal in accordance with a second cutoff frequency to allow a signal component based on biological information to pass through; an amplitude-component extracting unit extracting a first feature quantity related to an amplitude component from a signal passed through the first and/or second filter units; a frequency-component extracting unit extracting a second feature quantity related to a frequency component from a signal passed through the first and/or second filter units; and a recognizing unit recognizing a state of the space by using the first and second feature quantities.


Find Patent Forward Citations

Loading…