The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Feb. 29, 2016
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventor:

Kenichi Anzou, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31724 (2013.01); G01R 31/318547 (2013.01); G01R 31/318555 (2013.01);
Abstract

According to one embodiment, a semiconductor integrated circuit comprises: a tested block including a test control circuit; and a control circuit configured to output a first signal. The test control circuit performs a test of at least a first test pattern of the test patterns for the scan chain in accordance with the first signal during a first non-access state period of the tested block, and performs a test of at least a second test pattern following the first test pattern of the test patterns for the scan chain in accordance with the first signal during a second non-access state period of the tested block, and the test of the first test pattern and the test of the second test pattern are performed discontinuously.


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