The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Aug. 16, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Steven M. Douskey, Rochester, MN (US);

Raghu G. Gopalakrishnasetty, Bangalore, IN;

Mary P. Kusko, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2882 (2013.01); G01R 31/3177 (2013.01); G01R 31/31701 (2013.01);
Abstract

Embodiments herein describe the design of a scan cell within an integrated circuit. The scan cell operates in either a test mode or a normal functional mode according to a scan enable signal. The scan cell comprises delay logic including a plurality of delay elements, e.g., a plurality of transistors. The delay logic activates the delay elements only when the scan cell operates in the test mode. The delay elements are activated to change a scan latency of the scan cell. The scan latency of the scan cell is increased to mitigate or prevent hold violations.


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