The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Jun. 01, 2016
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

YongKeun Park, Daejeon, KR;

Jonghee Yoon, Daejeon, KR;

KyeoReh Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 33/483 (2006.01); G01N 33/02 (2006.01); G01N 21/49 (2006.01);
U.S. Cl.
CPC ...
G01N 33/483 (2013.01); G01N 21/49 (2013.01); G01N 33/02 (2013.01); G01N 2201/066 (2013.01); G01N 2201/06113 (2013.01);
Abstract

An apparatus and method for detecting microbes use laser speckles. The apparatus includes a light source configured to irradiate light into a sample to detect microbes, and a measuring part configured to measure laser speckles, which are formed due to a multiple scattering of the light which is incident into the sample, every reference time and to measure concentration of the microbes contained in the sample based on temporal correlation of the measured laser speckles.


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