The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Mar. 14, 2014
Kabushiki Kaisha Toshiba, Minato-Ku, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
Abstract
There is provided an eddy current flaw detection technique capable of, even when inspecting an object having a narrow portion with a small curvature radius, recognizing detection sensitivity change due to change of attitude of a probe. An eddy current flaw detection apparatusincludes: an AC power sourcewhich generates an excitation magnetic field in each of excitation coilsaccommodated in a probeto excite an eddy current in an inspection object; a detecting sectionwhich detects a detection signal generated by an induction magnetic field induced by the eddy current in each of detection coilsaccommodated in the probe; an output sectionwhich outputs flaw detection data based on the detection signals; a storage sectionwhich mutually associates and stores the detection signals detected at the same timing from the plurality of coils; and an evaluating sectionwhich evaluates an attitude of the probebased on the plurality of detection signals detected at the same timing and associated with each other.