The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Apr. 07, 2017
Applicant:
The Governing Council of the University of Toronto, Toronto, CA;
Inventors:
Assignee:
The Governing Council of the University of Toronto, Toronto, Ontario, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); B01L 3/00 (2006.01); G01N 1/40 (2006.01); G01R 33/12 (2006.01); G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1484 (2013.01); B01L 3/50273 (2013.01); B01L 3/502784 (2013.01); G01N 1/4022 (2013.01); G01N 3/32 (2013.01); G01N 15/1463 (2013.01); G01R 33/12 (2013.01); B01L 2300/14 (2013.01); B01L 2400/0487 (2013.01);
Abstract
Methods and apparatuses for determining a material characteristic of a sample material are disclosed. A sample material is loaded to a plurality of cells. An interference material is disposed relative to the sample material such that the interference material at least retards the transport of the sample material from a one of the cells to at least another one of the cells. For each one of the cells, independently: a stimulus is applied to the sample material in the cell such that a conditioned sample material is obtained; and a material characteristic of the conditioned sample material is sensed.