The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

May. 29, 2013
Applicant:

Endress + Hauser Gmbh + Co. KG, Maulburg, DE;

Inventors:

Thomas Blodt, Basel, CH;

Peter Klofer, Steinen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01F 23/00 (2006.01); G01F 23/296 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01F 23/0076 (2013.01); G01F 23/296 (2013.01); G01F 23/2962 (2013.01);
Abstract

A fill-level measuring device for determining the fill level of a process medium in a container by means of a travel-time method. The fill-level measuring device is distinguished by features including that the fill-level measuring device has structure for determining the dielectric constant of a second medium, which is located between the measuring device and the process medium. The structure for determining the dielectric constant comprises at least one waveguide for a high-frequency measuring signal, wherein such waveguide is filled at least sectionally with a dielectric and embodied and arrangeable in such a manner that the dielectric forms with the second medium an interface, at which a significant fraction of the measuring signal supplied to the second medium via the waveguide is reflected. Furthermore, an apparatus for determining the dielectric constant and a system of such an apparatus and a fill-level measuring device are proposed.


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