The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Apr. 14, 2016
Xing Yin, Jiangsu, CN;
Xing Yin, Changzhou, CN;
BEIJING QINGYING MACHINE VISUAL TECHNOLOGY CO., LTD., Changzhou, Jiangsu, CN;
Abstract
A system for measuring object points on a three-dimensional object using a planar array of a multi-camera group, and a measuring method, are provided. The system is useful in the field of optical measuring technologies. The method includes establishing a measuring system of at least one four-camera group wherein digital cameras form a 2×2 array; matching an image object point acquired by the camera group; upon matched object point image coordinates, calculating coordinates of spatial locations of respective object points; upon coordinates of the spatial locations, calculating other three-dimensional dimensions of the measured object to be specially measured to form three-dimensional point clouds and establish a three-dimensional point clouds graph for performing three-dimensional stereoscopic reproduction. Here, full matching is performed for all measured points of the measured object by directly translating, superimposing, and comparing, point-by-point, the pixel points of measured images in X and Y-axes directions. In this way a three-dimensional object may be reproduced.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile