The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Oct. 09, 2014
Optoplan As, Tiller, NO;
Erlend Ronnekleiv, Trondheim, NO;
Ole Henrik Waagaard, Trondheim, NO;
OptoPlan AS, Trondheim, NO;
Abstract
A method of processing data from a distributed fibre-optic interferometric sensor system for measuring a measurand, the system comprising multiple interferometric sensors. The method comprises interrogating two or more of the multiple interferometric sensors to record a raw measurement time series for each of the sensors. The method further comprises calculating a common reference time series as a measure of central tendency of the raw measurement time series from two or more reference sensors, the reference sensors being selected from the multiple interferometric sensors. Finally, the method comprises compensating at least one raw measurement time series from a measurement sensor selected from the multiple interferometric sensors with the common reference time series to produce a compensated measurement time series, the measurement sensor being configured to be sensitive to the measurand. The invention further relates to a distributed fibre-optic interferometric sensor system.