The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Jul. 31, 2015
Applicants:

Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.), Hyogo, JP;

Kobelco Research Institute, Inc., Hyogo, JP;

Inventors:

Masato Kannaka, Kobe, JP;

Kazuhiko Tahara, Kobe, JP;

Hideki Matsuoka, Kobe, JP;

Noritaka Morioka, Kobe, JP;

Hidetoshi Tsunaki, Kobe, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01B 7/28 (2006.01); G01B 11/24 (2006.01); G01B 7/14 (2006.01); G01B 11/14 (2006.01); G01B 7/06 (2006.01); G01B 11/06 (2006.01); B29C 31/00 (2006.01); B29C 39/00 (2006.01);
U.S. Cl.
CPC ...
G01B 7/28 (2013.01); G01B 7/08 (2013.01); G01B 7/14 (2013.01); G01B 11/06 (2013.01); G01B 11/14 (2013.01); G01B 11/2441 (2013.01); B29C 31/00 (2013.01); B29C 39/00 (2013.01); G02B 2207/00 (2013.01);
Abstract

A shape measurement device and a shape measurement method according to the present invention measure, for first and second distance measurement units which are disposed so as to be opposed to each other with a measurement object to be measured interposed therebetween and each measure a distance to the measurement object, first and second displacements of the first and second distance measurement units in an opposition direction, and obtain, as a shape of the measurement object, a thickness of the measurement object in the opposition direction, the thickness being corrected with the measured first and second displacements, based on first and second distance measurement results measured by the first and second distance measurement units, respectively.


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