Reims, France

Valeriu Vrabie

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Valeriu Vrabie: Innovator in Neural Network Characterization

Introduction

Valeriu Vrabie is a notable inventor based in Reims, France. He has made significant contributions to the field of neural networks, particularly in the characterization of samples using advanced methods. His innovative approach combines spectral imaging with machine learning techniques to enhance the analysis of various samples.

Latest Patents

Valeriu Vrabie holds a patent for a method titled "Method for characterising samples using neural networks." This method involves characterizing a sample by utilizing spectral images. It generates a volume of values for an observed parameter from the images across multiple pixel coordinates and acquisitions. The process includes extracting input data corresponding to these values, applying conversion functions, and training a neural network to identify features of the sample. The extracted features are then used to classify the input data into various classes, each representing distinct characteristics of the sample.

Career Highlights

Throughout his career, Valeriu Vrabie has worked with esteemed institutions such as the University of Reims Champagne-Ardenne and CRITT-MDTS. His work has focused on integrating neural networks with practical applications in sample characterization, showcasing his expertise in both theoretical and applied research.

Collaborations

Valeriu has collaborated with professionals like Eric Perrin and Sihem Mezghani, contributing to the advancement of research in his field. Their joint efforts have furthered the understanding and application of neural networks in various scientific domains.

Conclusion

Valeriu Vrabie's innovative work in neural network characterization exemplifies the intersection of technology and science. His contributions continue to influence the field and pave the way for future advancements in sample analysis.

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