Asmpt Singapore Pte. Ltd.

Zui Hong Lee

Keng Yew Song

Mow Huat Goh

Jian Min Chen

Kien Kia Tan

A shear test is conducted on an interconnect bond formed on a surface of an electronic device by first determining a profile of the surface, and based on the determined profile, determining a shearing path which is at a substantially constant distance from the profile of the surface for a shear test tool to conduct the shear test on the interconnect bond. The shear test tool is then guided to move along the determined shearing path to measure a shear force of the interconnect bond.

Method and apparatus for conducting shear tests on interconnect bonds

An apparatus for calibrating a shear test tool utilizes a resilient pivot mechanism to improve accuracy and reliability of the force calibration. The apparatus includes a fixed element, a pivotable element configured to be rotatable relative to the fixed element, and a resilient pivot mechanism coupled between the fixed element and the pivotable element to form a pivot. The pivotable element is rotatable about the pivot to lift a weight coupled to the pivotable element when the shear test tool applies a force on the pivotable element in order to rotate the pivotable element and lift the weight.

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Singapore, Singapore

Zui Hong Lee