Boe Technology Group Co., Ltd.

Beijing Boe Optoelectronics Technology Co., Ltd.

Zijin Lin

Haisheng Zhao

Xiaoguang Pei

Chaoyang Deng

Dongjiang Sun

Chao Tian

Zhilong Peng

Haitao Ma

Yaowei Wang

Tielin Zhang

Yinghua Tian

Kuo Chang

Disclosed are a backlight module, a display panel, and a display device. The backlight module includes a module frame and at least one first conductive tip structure disposed inside the module frame, the first conductive tip structure includes a first conductive tip, the first conductive tip being in an exposed state of being exposed out from the module frame. The backlight module, according to a point discharge principle, preferentially performs discharging on static electricity through the conductive tip structure, to provide a novel antistatic backlight module.

Backlight module, display panel and display device

An array substrate is disclosed, which includes a substrate, at least one test line, an insulating layer, and an electrostatic shielding pattern. The at least one test line is disposed over the substrate. The insulating layer is disposed over the at least one test line. The electrostatic shielding pattern is disposed over, and insulated by the insulating layer from, the at least one test line in the array substrate. The electrostatic shielding pattern is configured to absorb, and guide out from the array substrate, static electricity to thereby avoid the static electricity from entering an interior of the array substrate via the at least one test line. A method for manufacturing the array substrate, and a display panel containing the array substrate are also provided in the disclosure.

Array substrate and manufacturing method, and display panel

A method for manufacturing thin film transistor, a method for manufacturing array substrate, an array substrate and a display device are provided. The method for manufacturing thin film transistor includes forming an intermediate layer on a substrate, patterning the intermediate layer to form an intermediate layer reserved region and an intermediate layer unreserved region, where the intermediate layer unreserved region corresponds to a pattern of a first structure layer, forming, on the substrate with a pattern of the intermediate layer, a material layer from which the first structure layer is formed, and removing the intermediate layer, and forming the pattern of the first structure layer through a portion of the material layer remaining on the substrate.

Method for manufacturing thin film transistor, method for manufacturing array substrate, array substrate and display device

The present disclosure relates to an image calibrating method and device of a testing apparatus for thin film transistor (TFT) substrate. The method comprises following steps of: calculating an image offset value by using coordinate information of each pixel in a prescribed target image obtained by the testing apparatus for the thin film transistor substrate; and determining whether the offset value is smaller than a prescribed threshold value, in a case where the offset value is not smaller than the prescribed threshold value, adjusting the image by using the offset value and recalculating the offset value by using the coordinate information of each pixel in the adjusted image; in a case where the offset value is smaller than the prescribed threshold value, calibrating the image obtained by the testing apparatus for the thin film transistor substrate with the offset value as a calibrating value. The calibrating efficiency and calibrating accuracy of the testing method for the thin film transistor substrate are enhanced according to the present disclosure.

Image calibrating method and device of testing apparatus for thin film transistor substrate

An alignment system includes: a light emitting device located on one side of an object to be aligned for emitting light towards the object to be aligned; a light receiving device located on the other side of the object to be aligned and at a standard position corresponding to an alignment mark disposed on the object to be aligned, the light receiving device being provided with a plurality of light sensors for sensing light emitting from the light emitting device on an end surface facing the object to be aligned; a processor configured to receive sensing signals transmitted from each of the light sensors and determine whether the object to be aligned is aligned accurately according to whether each of the light sensors sense the light emitted from the light emitting device. This alignment system shortens the processing time and enhances the processing efficiency.

Alignment system

The present invention provides a marking apparatus for a display panel and a marking method for a display panel. The marking device comprises an image acquiring module, a simulated marking module and a real marking module. A simulated marking line is drawn, by the simulated marking module, in an image acquired by the image acquiring module, of a region containing a position where a defect occurs on a display panel to be marked. The real marking module automatically draws a real marking line on the display panel to be marked according to the simulated marking line. Thus, a position where a defect occurs on a display panel to be marked is accurately marked, and it is convenient for an engineer to accurately locate and sample the defective position in the subsequent analysis process.

Marking apparatus and marking method for display panel

An array substrate comprising an electrical connection block exposed to its surface. By manufacturing a passivation layer via hole in a passivation layer, a drain electrode or a pixel electrode of a thin-film transistor is exposed, so that the electrical connection block fills the passivation layer via hole and is provided in contact with the drain electrode or the pixel electrode. Thereby, when the electrical characteristic value of a TFT is measured, the pixel probe of a measuring apparatus may be electrically connected with the drain electrode or the pixel electrode by directly contacting the electrical connection block, so that the measuring of the electrical characteristics of the TFT may be realized.

Array substrate, method for manufacturing the same and method for measuring the same, display device

The present invention provides a cleaning apparatus including at least one dust particulate absorber device(s) and a wiper device. The at least one dust particulate absorber device(s) is used for absorbing foreign matters, the wiper device is used for wiping and cleaning, and the dust particulate absorber device(s) and the wiper device are arranged in the horizontal direction.

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Beijing, China

Zijin Lin