Gm Global Technolgoy Operations, Inc.

University of Iowa Research Foundation

Kla Corporation

Zhuoning Yuan

Wei Tong

Kris Bhaskar

Jacob Alan Bond

Jing Zhang

Siddhartha Gupta

Yujie Dong

Yan Yan

Qi Qi

Tianbao Yang

A computer-based automated method of performing classification includes learning a deep neural network by maximizing an area under a receiver operating characteristic curve (AUC) or precision-recall curve (AUPRC) score wherein a margin-based surrogate loss function is applied, receiving an input into a deep neural network, and processing the input to the deep neural network to generate a prediction, wherein the prediction comprises a classification of the input. The computer-based automated method may be performed by executing instructions in at least one processor, and wherein said instructions are stored on a non-transitory memory readable by the at least one processor.

Robust deep AUC/AUPRC maximization: a new surrogate loss and empirical studies on medical image classification

An automated driving system includes an object detection system. A neural network image encoder generates image embeddings associated with an image including an object. A neural network text encoder generates concept embeddings associated with each of a plurality of concepts. Each of the plurality of concepts is associated with one of at least two object classes. A confidence score module generates a confidence score for each of the plurality of concepts based on the image embeddings and the concept embeddings associated with the concept. An object class prediction module generates a predicted object class of the object based on an association between a set of concepts of the plurality of concepts having at least two of the highest values of the generated confidence scores and the one of the at least two object classes associated with a majority of the set of concepts.

Systems and methods for classifying detected objects in an image at an automated driving system

Methods and systems for learnable defect detection for semiconductor applications are provided. One system includes a deep metric learning defect detection model configured for projecting a test image for a specimen and a corresponding reference image into latent space, determining a distance in the latent space between one or more different portions of the test image and corresponding portion(s) of the corresponding reference image, and detecting defects in the one or more different portions of the test image based on the determined distances. Another system includes a learnable low-rank reference image generator configured for removing noise from one or more test images for a specimen thereby generating one or more reference images corresponding to the one or more test images.

Learnable defect detection for semiconductor applications

Growing community of inventors

Iowa City, IA, United States of America

Zhuoning Yuan