Keysight Technologies, Inc.

Agilent Technologies, Inc.

Zhu Wen

Ya Jing

Hong-Wei Kong

Li Cao

Thorsten Hertel

Yu Zuo

Shao-Bo Chen

Xu Zhao

Hongwei Kong

A method determines corrected TRP or TIS of an AUT in a near-field test chamber, the AUT having a phase center offset from a rotation center of the test chamber. The method includes performing EIRP or EIS measurements of the AUT at first sampling grid points on a first closed-surface geometric shape centered at the rotation center; mapping second sampling grid points to the first closed-surface geometric shape to provide mapped sampling grid points on the first closed-surface geometric shape, where the second sampling grid points are on a second closed-surface geometric shape centered at the phase center of the AUT; determining estimated EIRPs or EISs at the mapped sampling grid points using the EIRP or EIS measurements; scaling the estimated EIRPs or EISs at the mapped sampling grid points to provide scaled EIRPs or EISs; and calculating the corrected TRP or TIS based on the scaled EIRPs or EISs.

System and method for determining corrected total radiated power (TRP) or corrected total isotropic sensitivity (TIS) of offset antenna under test

A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.

System and method for performing measurements of antenna under test offset from center of quiet zone

A system and method are provided to determine equivalent isotropic radiated power (EIRP), effective isotropic sensitivity (EIS) and/or signal quality of a DUT in a test chamber, where the DUT has an AUT that has beam-forming capability and is offset from a center of a quiet zone of the test chamber. The method includes establishing a connection with the DUT using a far-field probe antenna in a far-field of the test chamber relative to the AUT so that the AUT forms a beam in a beam peak direction towards the far-field probe antenna; locking the beam of the AUT in the beam peak direction to prevent subsequent beam forming; and performing a near-field measurement of the EIRP, the EIS and/or the signal quality of the AUT with the beam locked in the beam peak direction using a near-field probe antenna in a near-field of the test chamber.

A multilevel triggering system includes a trigger block library configured to store multiple triggering function modules for performing triggering functions to detect corresponding triggering conditions, respectively; and a triggering matrix including multiple triggering levels, each triggering level being configurable to include one or more trigger blocks and each trigger block being configurable to implement a triggering function module of the multiple triggering function modules, each trigger block generating a corresponding block trigger when the corresponding triggering condition of the triggering function module implemented by the trigger block is detected in a portion of an input signal. Each triggering level is configured to generate a corresponding level trigger when each of the one or more trigger blocks in the triggering level generates the corresponding block trigger. The triggering matrix is configured to generate a complex trigger signal when the triggering levels generate corresponding level triggers.

Multilevel triggering system for outputting complex trigger signal

A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.

Method and system for testing antenna array using middle field antenna pattern

A method for testing an antenna array uses a probe antenna to measure an RF signal antenna pattern of the antenna array. The method includes measuring the RF signal antenna pattern at a first position and at a second position relative to the antenna array. The first position and the second position are located at different distances from the antenna array in a middle field of the antenna array. The middle field satisfies near field criteria for the antenna array and also satisfies far field criteria for each antenna element of the plurality of antenna elements in the antenna array. The method further includes determining, based on the first measurement and based on the second measurement, the RF signal antenna pattern at a third position relative to the antenna array located in a far field of the antenna array.

System and method for obtaining far field radiated power with multiple radiated power measurements in middle field range

A system and a method to determine beam dynamics and multi-user performance of a base station having an antenna array including multiple antenna elements are disclosed. The system includes a measurement probe antenna positioned in a mid-field of the antenna array, a reference antenna having a fixed position with respect to the base station antenna array, and a coupling probe array including multiple coupling probe antennas positioned in a reactive field of the base station antenna array for coupling RF signals of the antenna elements to selected coupling probe antennas to form a high dimension radiation channel matrix between the antenna array and the coupling probe array. The system further includes a channel emulator configured to receive the measured antenna element patterns from the measurement probe antenna, to receive the RF signals coupled to the selected coupling probe antennas, to provide bi-directional channel models of channels between the base station and user devices.

System and method for determining beam dynamics and multi-user performance of base station

A multilevel triggering system of a signal analysis instrument outputs a complex trigger signal. The triggering system includes a trigger controlled buffer for receiving and buffering an input signal, triggering function modules, and a triggering matrix. Each triggering function module performs a corresponding triggering function for detecting a corresponding triggering condition. The triggering matrix includes multiple triggering levels, each of which is configurable to include at least one trigger block and each trigger block being configurable to implement one of the triggering function modules. Each trigger block generates a corresponding block trigger when the triggering condition of the corresponding triggering function module is detected in the buffered input signal. Each triggering level generates a corresponding level trigger when the at least one trigger block in the triggering level generates the corresponding block trigger, and the triggering matrix generates the complex trigger signal when the triggering levels generate corresponding level triggers.

A testing system includes a test chamber including an array of spaced-apart probe antennas and a positioner configured to support a device under test (DUT) having an array of digital antenna elements, a radio frequency (RF) signal generator and analyzer configured to send and receive RF test signals to/from the spaced-apart probe antennas, and an RF switch component configured to selectively couple the RF signal generator and analyzer to the array of spaced-apart probe antennas within the test chamber. A digital test instrument includes at least one digital signal generator and analyzer configured to generate digital test signals to the digital antenna elements of the DUT in a transmitter test mode, and to analyze received digital test signals from the digital antenna elements of the DUT in a receiver test mode, a programmable hardware device configured to implement a custom digital fiber interface protocol for the generated and received digital test signals, and a digital fiber interface configured to couple the programmable hardware device to the array of digital antenna elements of the DUT and transceive the digital test signals to/from the array of digital antenna elements of the DUT. A synchronization module is configured to synchronize the RF signal generator and analyzer, and the digital test instrument. A test controller is configured to control operation of the positioner, the RF signal generator and analyzer, the RF switch component and the digital test instrument during testing of the DUT.

Systems and methods for test and calibration of MIMO antenna arrays including a digital interface

A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

System and method for performing over-the-air tests for massive multi-input/multi-output wireless system

A test system includes a single-channel signal generator configured to generate an autocorrelation test signal to be distributed to each of a plurality of RF channels of a device under test (DUT). A time offset network includes a plurality of time offset channels each corresponding to one of the plurality of RF channels of the DUT, and is configured to, in combination with the DUT, provide corresponding autocorrelation test signals each with a different time delay as respective RF channel test signals. A single-channel measurement instrument is configured to process a single-channel test signal, based upon a combination of the RF channel test signals, to independently measure at least one characteristic of each of the RF channels of the DUT. The time offset network may be configured to be coupled between the single-channel signal generator and the DUT. Or, the time offset network may be configured to be coupled between the DUT and the single-channel measurement instrument.

System and method for test and/or calibration of multi-channel RF communication devices

A system and method for determining the performance of a channel emulator includes an input signal, at least one transmitter configured to receive the input signal, the at least one transmitter coupled to at least one receiver through the channel emulator, the at least one transmitter configured to transmit the input signal through the channel emulator, the at least one receiver configured to receive a faded receive signal. The system also comprises a signal processor configured to receive a processor signal and the faded receive signal, the signal processor configured to correlate the processor signal and the faded receive signal to develop a correlated signal that represents a channel impulse of the channel emulator. The channel impulse of the channel emulator is used to extract at least one channel coefficient that reflects the performance of the channel emulator.

Growing community of inventors

Beijing, China

Zhu Wen