View, Inc.

Seagate Technology Incorporated

Zhiwei Cai

Robert T Rozbicki

Dhairya Shrivastava

Anshu A Pradhan

Sridhar Karthik Kailasam

Dane Thomas Gillaspie

Ronald M Parker

Todd William Martin

Jeffrey Shane Reiter

Stephen Eric Barlow

Methods are provided for fabricating electrochromic devices that mitigate formation of short circuits under a top bus bar without predetermining where top bus bars will be applied on the device. Devices fabricated using such methods may be deactivated under the top bus bar, or may include active material under the top bus bar. Methods of fabricating devices with active material under a top bus bar include depositing a modified top bus bar, fabricating self-healing layers in the electrochromic device, and modifying a top transparent conductive layer of the device prior to applying bus bars.

Mitigating defects in an electrochromic device under a bus bar

A system and method for reducing and controlling the number of defects due to carbon inclusions on magnetic media is disclosed. A diamond like carbon protective layer is deposited on magnetic media using a rotary cathode target assembly. The target and cathode are cylindrical in shape and are mounted on holder that allows the target and cathode to rotate while holding a magnet fixed. The target surface is periodically swept in through a plasma which sputters off the surface of the target. This prevents the build up of redeposited material on the target and consequently keeps the target surface cleaner. The reduction of redeposited material on the target surface reduces the number of unwanted particulates which are ejected from the surface, manifesting themselves as disk defects.

System and method for controlling thin film defects

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Fremont, CA, United States of America

Zhiwei Cai