University of South Florida

University of Rochester

Duke University

Zhimin Shi

Robert W Boyd

Ziyi Zhu

Darrick Hay

Yiyu Zhou

Daniel J Gauthier

Mohammad Mirhosseini

Mehul Malik

An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

Measurement apparatus of wavefront and polarization profile of vectorial optical fields

An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

Measurement apparatus of vectorial optical fields

An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

A wavefront sensing technique using Polarization Rotation INTerferometry (PRINT) provides a self-referencing, high-resolution, direct measurement of the spatially dependent phase profile of a given optical beam. A self-referencing technique is used to create a reference beam in the orthogonal polarization and a polarization measurement to measure the spatial-dependent polarization parameters to directly determine the absolute phase profile of the beam under test. A high-resolution direct measurement of the spatially-resolved phase profile of one or more optical beams is realized.

Wavefront sensing apparatus, method and applications

According to the invention, a highly optically dispersive medium is one in which the absolute value of the group index of refraction of the medium is equal to or greater than four. An optical spectroscopic parameter detection and/or measurement apparatus may be in the form of an interferometer, a spectral interferometer, a spectrometer, a wavemeter, a tunable narrowband filter The embodied devices include a highly dispersive medium that appropriately can facilitate either a slow-light effect or a fast-light effect, which is disposed in a propagation path of an electro-magnetic (EM) input field and, a detector disposed in a manner to detect an output field resulting from the input filed interaction with the highly dispersive medium. Methods involve measuring a spectroscopic parameter using an optical spectroscopic parameter detection and/or measurement apparatus that incorporates a highly dispersive medium.

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Tampa, FL, United States of America

Zhimin Shi