International Business Machines Corporation

Arizona State University

Zhichao Zhang

Rodolfo Enrique Diaz

Ibrahim M Elfadel

Matthew S Angyal

Alina Deutsch

Jeffrey W Peebles

Richard LeBaron

Lorena Lozano-Plata

A plane wave antenna including: a horn antenna; a waveguide at least partially inside the horn antenna, wherein the waveguide includes: a central dielectric slab increasing in width toward the horn antenna and with a first dielectric constant, an upper slab above the central dielectric slab with a second dielectric constant, and a lower slab below the central dielectric slab with the second dielectric constant; wherein the central dielectric slab has a substantially constant thickness less than a quarter of a wavelength at a highest frequency of operation of the plane wave antenna.

Compact broad-band admittance tunnel incorporating gaussian beam antennas

Techniques are disclosed for determination of parameter variability for one or more given interconnects of a plurality of interconnects in a simulated semiconductor circuit. The simulated semiconductor circuit is defined at least in part by a plurality of input parameters. From a distribution of first values of a given input parameter, a plurality of the first values are determined to use when calculating a corresponding plurality of second values for each of one or more output parameters. By using at least the determined plurality of first values for the given input parameter and selected values for other input parameters in the plurality of input parameters, the corresponding plurality of second values are calculated for each of the one or more output parameters. The one or more output parameters correspond to the one or more given interconnects. Each of the second values corresponds to one of the determined plurality of first values.

Techniques for determining parameter variability for interconnects in the presence of manufacturing uncertainty

Growing community of inventors

Tempe, AZ, United States of America

Zhichao Zhang