Hon Hai Precision Industry Co., Ltd.

Hong-fu Jin Precision Industry (shenzhen) Co., Ltd.

Zhi-Xin Xu

Han-Che Wang

Hua-Dong Cheng

Feng Zhou

Ruey-Shyang You

Bin-Gang Duan

A method for testing electronic apparatuses is provided. The method includes: reading an identification (ID) of an emulator adapter; searching for the script name in a test table according to the ID; fetching the script from a storage according to the determined script name and running the fetched script to pass each of input commands; and receiving and identifying each of the input commands to simulate a key input via an electrical conductive path, correspondingly to the input command, of the emulator adapter, such that an input key corresponding to the key input of the to-be-tested electronic apparatus is activated and the to-be-tested electronic apparatus performs a function associated with the input key correspondingly. A related test apparatus is also provided.

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Shenzhen, China

Zhi-Xin Xu