Beam Engineering for Advanced Measurements Co.

Zhi J Liao

Nelson V Tabirian

David E Roberts

Justin L Sigley

Diffractive optical structures, lenses, waveplates, devices, systems and methods, which have the same effect on light regardless of temperature within an operating temperature range. Temperature-compensated switchable diffractive waveplate systems, in which the diffraction efficiency can be maximized for the operating wavelength and temperature by means of adjustment of the electric potential across the liquid crystal or other anisotropic material in the diffracting state of the diffractive state, based on prior measurements of diffraction efficiency as a function of wavelength and temperature. The switchable diffractive waveplates can be a switchable diffractive waveplate diffuser, a switchable cycloidal diffractive waveplate, and a switchable diffractive waveplate lens. An electronic controller can apply an electric potential to the switchable diffractive waveplate. Amplitudes of the electric potential can be determined from lookup tables such that diffraction efficiency at an operating wavelength and measured temperature is maximized. A communications channel can transfer the measured temperature from temperature measurement means to the electronic controller.

Diffractive waveplate devices that operate over a wide temperature range

Diffractive waveplate lenses, mirrors, devices, systems and methods for performing imaging over a broad spectral band in imaging systems, such as but not limited to astronomical imaging, surveillance imaging, and in communication systems, such as laser communication systems. Corrector mirrors are used with a flat diffractive wave diffractive waveplate lens so that chromatic aberrations of the diffractive waveplate lens are reduced with the imaging system.

Broadband imaging with diffractive waveplate coated mirrors and diffractive waveplate objective lens

Sensors, devices, apparatus, systems and methods for replacing microlens arrays with one or more switchable diffractive waveplate microlens arrays for providing measurements of wavefronts and intensity distribution in light beams with high spatial resolution with a single optical radiation sensor. The device acts like a conventional Shack-Hartmann wavefront sensor when the microlens array elements are in focusing state, and the device performs light beam intensity profile characterization acting as a beam profiler when the optical power of lens array elements is switched off.

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Apopka, FL, United States of America

Zhi J Liao