Shenzhen Futaihong Precision Industry Co., Ltd.

Fih (hong Kong) Limited

Tencent Technology (shenzhen) Company Limited

Sutech Trading Limited

Fih (hing Kong) Limted

Zhi Feng Cheng

Lei Li

Ping Chen

Chang-Fa Sun

Lin-Sen Dong

Xue-Liang Zhai

Yong-Zhi Tao

Dong Li

Ai-Ge Sun

Ji-Wen Yang

Jian-Gui Wu

Hong-Yan Li

Wen-Quan Xu

Zhi-Qiang Jiang

Chun-Ying Wang

Li-Ping Huang

Xian-Cui Du

Ming-Feng Li

Bai Yu Qiu

Yan-Xin Yu

Hu Li

Li-Ping Yang

Li Chang

A web page grabbing method is provided. A target web page on a website is grabbed, the target web page including a web page corresponding to a Hypertext Markup Language 5 (H5) content and a web page corresponding to a non-H5 content. The web page corresponding to the H5 content is detected according to web page source code of the target web page. Dynamic rendering is performed on the web page corresponding to the H5 content, to obtain a rendered web page. Content details information corresponding to the H5 content is extracted from the rendered web page.

Web crawling method and server

A clamping device for clamping a portable electronic device is provided. The clamping device includes a mounting board and a clamping mechanism. The clamping mechanism includes two adjusting members, two sliding blocks, and a sliding rail. The adjusting members can adjust the positions of the sliding blocks on the sliding rail. The sliding rail is selectively attached to the mounting board, either horizontally or vertically.

Clamping device for portable electronic device

A device for determining dimensions of a workpiece includes a locating apparatus, a determining apparatus and a main processor. The locating apparatus includes a locating board supporting workpieces and defining at least one detecting aperture therethrough. The determining apparatus includes a detecting module, the detecting module includes at least one laser detector, each laser detector includes a laser emitter and a laser receiver respectively mounted on two opposite sides of the locating board. The main processor is connected to the locating apparatus and the determining apparatus, the laser emitter emits laser beams traveling through the detecting aperture and received by the laser receiver, and the main processor determines the dimension of the workpiece according to the dimension of parts on the laser receiver shielded by the workpiece.

Device for determining dimension of a workpiece

A fatigue test apparatus for thin workpiece includes a supporting module, a driving mechanism, a first connecting module, a second connecting module, a first holding post, a second holding post and a computer system. The first and second connecting modules are respectively fixed to two sides of the supporting module. Ends of the first holding post and the second holding post are fixed to the first and second connecting modules. The computer system electronically connects with and controls the driving mechanism. The first holding post and the second holding post are drive to rotate by the driving mechanism.

Fatigue test apparatus for thin element of electronic device

A flexible/adjustable fixing system () for fixing a workpiece () includes an information management module (), a plurality of driving devices (), and a positioning device (). The information management module receives and processes the position information of the workpiece. The driving devices electronically couple with the information management module. The positioning device includes a platform () and a plurality of positioning pins (). One end of the workpiece is positioned in a certain area of the platform. Each respective pin is attached to a corresponding driving device. When the driving device receives an order/signal from the information management module, the positioning pin is selectably driven relative to (e.g., toward, away from) the workpiece by the driving device.

Flexible fixing system for product testing

A testing device () configured for testing a multihole workpiece () with a plurality of holes (), includes a detecting station () and an inspecting box (). The detecting station positions a plurality of detecting pins () and a plurality of detecting apparatus (). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.

Testing devices for multihole workpiece

A measuring system () for flatness degree measurement includes a measuring instrument () and a processing device (). The measuring instrument has a base (), a guide column (), a sliding member (), a digital micrometer () and a holding member (). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece () and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.

Micrometer-based measuring system and method of using same

A testing system () is used to test a flip-type electronic device (). The electronic device includes a cover () and a main body (). A hinge () connects with the cover and the main body. The testing system includes a base (), a plummer (), a flipping device () and a control device (). The plummer is fixed on the base for locking the electronic device. The flipping device is fixed on the base for opening and closing the cover of the electronic device. The control device includes an optical fiber sensor () for sensing the movement of the cover of the electronic device. The control device connects with the flipping device so as to control the flipping device.

Testing system for flip-type electronic device

A key testing apparatus () is provided. The key testing apparatus includes a base () and an actuator (). The actuator includes a testing member () and a mounting member (). The mounting member includes at least one base board () fixed to the base, a lower board (), a mounting board (), and a mounting sheet (). The lower board is adjustably attached to the base board. The mounting board is adjustably attached to the lower board. The mounting sheet is adjustably attached to the mounting board. The clamping device includes a base desk (), a clamping platform (), at least one first clamping board () and second clamping board (). The base desk is adjustably attached to the base. The clamping platform, at least one first clamping board, and at least one second clamping board are adjustably attached to the base desk.

Key testing apparatus

An exemplary testing mechanism () is used for testing for a sufficiency of a casing. The testing mechanism includes a framework () and a testing module (). The framework includes a base board () and a pillar (). One end of the pillar is mounted on the base board. The testing module includes a main board () and at least one testing pin (). The main board is slidably mounted on the pillar. A bottom end of the testing pin is slidably mounted to the main board. A top end of the testing pin is positioned adjacent to the base board of the framework. The at least one testing pin is located in a position corresponding to at least one mounting hole of a sufficient casing.

Testing mechanism for casings

A failure analysis system () for printed circuit board () includes testing equipment () and a monitor (). The testing equipment includes a base (), a fixing body (), a supporting arm () and a micrometer (). The fixing body and the supporting arm are both firmly fixed on the base. The printed circuit board is fastened to the fixing body. The micrometer is slidingly attached to the supporting arm. The micrometer has a pin () at one end thereof for resisting one end of the printed circuit board. The monitor electronically connects with the printed board for receiving signals from the printed circuit board. When the pin of the micrometer reaches a certain position, the signal transmitted to the monitor is broken.

Failure analysis system for printed circuit board and method using the same

A testing system for testing flatness of a surface of a workpiece includes a testing apparatus () and a processor (). The testing apparatus includes a testing box () and a measuring apparatus (). The testing box includes a plurality of holders (); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles () extending out of the testing box and a plurality of gauges () configured for measuring distance of the testing poles retracting into the testing box. Ends () of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.

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Shenzhen, China

Zhi Feng Cheng