Boe Technology Group Co., Ltd.

Beijing Boe Optoelectronics Technology Co., Ltd.

Beijing Boe Display Technology Co., Ltd.

Zhenhuan Tian

Hao Zhang

Lili Chen

Chenru Wang

Ruijun Dong

Wenhong Tian

Yulong Wu

Bin Zou

Ke Li

Jiarong Bai

Yupeng Chen

Na Han

Yufan Du

Kiyoung Kwon

Yunshuang Li

Tengfei Chen

A head up display system, including: a display screen used for displaying an image; an imaging lens arranged on a light exit side of the display screen and used for imaging an image displayed on the display screen; and a curved reflecting mirror arranged on the side of the imaging lens facing away from the display screen and used for receiving imaging light of the imaging lens and reflecting said light to the position where human eyes are located. Relative positions of the display screen and the imaging lens are fixed, and the imaging lens and the curved reflecting mirror adopt a separate structure.

Head up display system

The present invention is mainly related to a virtual reality all-in-one apparatus. The virtual reality all-in-one apparatus may comprise a middle frame, a front housing, and a core function module. The core function module may comprise a frame assembly and a display module mounted on the frame assembly.

Virtual reality all-in-one apparatus

The present invention relates to a substrate testing circuit comprising a testing bus and a testing signal terminal connected to the testing bus, a signal line to be tested in the substrate being connected to the testing bus via a signal connecting terminal, wherein a plurality of signal access terminals are provided on the testing bus; one testing branch is connected between each the signal access terminal and the testing signal terminal; and resistance values of the testing branches are the same. By means of the present invention, since a plurality of signal access terminals are introduced and the testing branches with the same resistance are added so that input resistances and impedances of testing signals across the display screen are substantially identical without making changes to process flow and device hardware structure, input resistances and impedances of respective signal lines are well averaged, thereby no obvious regional attenuation occurs in the testing signals within the pixel area to be tested irrespective of limitation in size of panel, so as to realize tests for panels with greater sizes.

Substrate testing circuit

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Beijing, China

Zhenhuan Tian