Western Digital Technologies, Inc.

Zhenhua Mai

Edwin Dale Barnes

Michael F Klett

Systems and methods are disclosed for testing performance of communications interfaces of computing devices. An electronic device tester is disclosed including a downstream communication interface configured to communicatively couple the electronic device tester to a device under test (DUT), wherein the electronic device tester is configured to identify a first internal hub of the DUT over the downstream communication interface, identify a second hub device connected to the DUT over a downstream interface port of the DUT, verify performance of the downstream interface port of the DUT at a first data rate by receiving data over a first downstream port of the second hub device via the downstream interface port of the DUT, and verify performance of the downstream interface port of the DUT at a second data rate by receiving data over a second downstream port of the second hub device via the downstream interface port of the DUT.

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Guangdon Province, China

Zhenhua Mai