Other

Zhengdong Zhang

Fang Liu

Yun Lu

Jianbo Sun

Xuguang Zhang

An embodiment of the present invention relates to a method for detection of short circuit conditions in an LED array having one or more LED strings, each of which includes one or more LED devices. The method includes determining a minimum voltage that is the lowest of voltages associated with cathode terminals of the one or more LED strings. The method also includes determining if said minimum voltage is between a lower limit voltage and an upper voltage limit. If said minimum voltage is between the lower limit voltage and the upper voltage limit, then a result of a short circuit testing can be considered valid. Here, the short circuit testing includes comparing a sampled voltage associated with a cathode voltage of one of the LED strings with a short-circuit reference voltage.

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Shanghai, China

Zhengdong Zhang