The Texas A&M University System

Zheng Lu

Edward S Fry

George W Kattawar

Deric J Gray

Xianzhen Zhao

Joseph A Musser

William C Merka

George S Kattawar

Jeffrey Katz

The invention relates an apparatus and method for forming a diffuse reflector. In one embodiment of the invention, a diffuse reflector is formed by exposing transmissive particles of a pre-determined purity to pressure and forming a material having desired diffuse reflective properties. The transmissive particles may further be thermally treated, such as by sintering, to form material having desired diffuse reflective properties. The treated transmissive particles may then be disposed in a vessel and define a cavity therein to form an integrated cavity diffuse reflector.

Highly diffuse reflector

An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in thefirst and second diffusive materialscavity and the transparent materialrespectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.

Apparatus and method for direct measurement of absorption and scattering coefficients in situ

An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.

Growing community of inventors

College Station, TX, United States of America

Zheng Lu