Boe Technology Group Co., Ltd.

Beijing Boe Display Technology Co., Ltd.

Zheng Bian

Ji Min Zhang

Jie Liu

Yujia Wang

Jinwei Zhu

Chong Guo

Dongsheng Xu

Yaoxie Zheng

Jianbing Su

Siyang Chen

Kaijie Liang

Yongyong Zhang

Shuyuan Liu

Shuai Xin

Tongbo Sun

The present disclosure provides a method and a device for inspecting a defect of a liquid crystal panel. The method includes steps of: performing AOI treatment on an image of the liquid crystal panel; determining a plurality of to-be-treated targets that do not meet a defect specification requirement in accordance with an AOI treatment result; ranking the plurality of to-be-treated targets in a predetermined order, and acquiring an aggregation degree parameter of every two adjacent to-be-treated targets of the ranked to-be-treated targets; comparing each aggregation degree parameter with a predetermined aggregation degree parameter to acquire a plurality of comparison results; and determining, in accordance with the plurality of comparison results, the to-be-treated targets corresponding to n consecutive aggregation degree parameters smaller than the predetermined aggregation degree parameter as aggregate-type defects of the liquid crystal panel, n being a natural number and greater than or equal to a predetermined value.

Method and device for inspecting defect of liquid crystal panel

The present disclosure provides a worktable for testing a liquid crystal panel. In one embodiment, the worktable for testing the liquid crystal panel includes: a table body, an upper surface of which being formed with a mounting groove in order to form a light-transmittance region; wherein, the table body is further formed with a slot that has an opening in a side surface of the table body and that is configured to mount a lower polarizer therein so that the lower polarizer at least covers the light-transmittance region. The present disclosure also provides a test apparatus including the mentioned worktable.

Worktable for liquid crystal panel test, and liquid crystal panel test apparatus

An alignment apparatus and an alignment detection method, which fall within a field of display technology, are disclosed herein. The alignment apparatus includes: a work table; a plurality of alignment rods provided on the work table, wherein a capacitor element is provided inside the alignment rod, and a capacitance of the capacitor element is changeable as the alignment rod deforms; and an alarm element connected to the capacitor element for giving an alarm when it receives a capacitance change value which exceeds a preset threshold value.

Alignment apparatus and alignment detection method

There are provided an array substrate and method for manufacturing the same, a display panel and method for testing the same, and a display apparatus. The array substrate comprises a display region and at least one bond region located outside of the display region; wherein a plurality of signal lines are disposed within the display region, and a plurality of wiring terminals connected to multiple ones of the plurality of signal lines through a plurality of first lead wires are disposed within each bond region; the array substrate further comprises one or more test regions corresponding to arbitrary one or more of the at least one bond region; wherein a plurality of test terminals are disposed within each test region, and the plurality of test terminals within any one of the one or more test regions are connected with the plurality of wiring terminals within a respective one of the at least one bond region through a plurality of second lead wires. The present invention implements a lead wire open test for a display panel for which the lead wire open test cannot be implemented in a traditional test mode.

Array substrate and method for manufacturing the same, a display panel and method for testing the same, and a display apparatus

Growing community of inventors

Beijing, China

Zheng Bian