Hon Hai Precision Industry Co., Ltd.

Fu Tai Hua Industry (shenzhen) Co., Ltd.

Hongfujin Precision Electronics (zhengzhou) Co., Ltd.

Zhen-Ke Zhang

Yan-Fang Yan

Jun Chen

Wei Wu

Eddy Liu

Xi-Hang Li

Ri-Qing Chen

Shi-Li Zhang

Xue-Feng Che

Zheng-Hu Jiang

Zhi-Qing Liu

Shun-Ming Wang

Jing-Wei Liu

An apparatus for testing electronic components includes a base, a screw rod structure, a first sliding portion, a second sliding portion, a vacuum-based or similar adsorption structure, and a probe. The screw rod structure is fixedly connected to one side of the base. The first sliding portion is slidably positioned on the screw rod structure. The second sliding portion is slidably positioned on the first sliding portion. The adsorption structure is arranged on the second sliding portion. The adsorption structure gathers and holds an electronic component. The probe and the electronic component are arranged to correspond. The probe is electrically connected to a test device. The test device tests the electronic component through the probe.

Apparatus for testing electronic components

An unpowered stop mechanism includes a mounting seat, a driving member, and a stop assembly. The stop assembly is located on the mounting seat and oppositely positioned to the driving member. The stop assembly includes a guide member, a stop member, and a hinge arm. The stop member is received within a guide slot defined in the guide member. The hinge arm is pivotably coupled to the guide member. The hinge arm protrudes from the guide member and is oppositely positioned to the driving member. The driving member drives the hinge arm to drive the stop member to retract within the guide slot. Then the driving member is moved to be spaced from the hinge arm, the stop member is driven by a resilient member received within the guide slot to protrude out of the guide slot.

Unpowered stop mechanism

Growing community of inventors

Zhengzhou, China

Zhen-Ke Zhang